Applications of Transmission Electron Microscopy Technique to Thin Film Studies: Review

There are two accepted deposition methods, that is to say chemical deposition means and physical deposition method could be used to produce thin films. The structure, plant structure, optical, compositional and electrical possessions of the obtained films were studied utilizing atomic force microscopy, scanning power microscopy, UV-visible spectrophotometer, x-ray dissemination, energy dispersive x-ray reasoning, scanning probe microscopy, photoluminescence spectroscopy, radioactivity fluorescence, x-ray photoelectron spectroscopy and Raman spectroscopy. Transmission energized matter microscopy technique was used to investigate the clear structure, crystal introduction, grain size and aspect of crystalline materials. In this work, the arrangement of thin films using various types of dethroning methods was reported. In addition, the features of the obtained films were studied utilizing transmission electron microscopy method based on selected biography review. Experimental results confirmed that film deposition process can powerfully affect the crystal construction, crystallite size and phase of lucid.

Author(s) Details:

Ho Soonmin,
Faculty of Health and Life Sciences, INTI International University, Putra Nilai – 71800, Negeri Sembilan, Malaysia.

Please see the link here: https://stm.bookpi.org/NFPSR-V5/article/view/8856

Keywords: Thin films, semiconductor, transmission electron microscopy, crystalline materials, grain size