Atomic Force Microscopy Characterization of Thin Films: A Review

Metal chalcogenide films have enticed excellent attention by way of their singular physical, ocular, and energetic characteristics. The obtained films presented superior absorption cooperative, direct band break and good transparency in the seeable portion. Therefore, these matters maybe used in ocular apertures, opto-electronic schemes, cosmic containers, radiation detectors, visual modulators and color of blood detector. In this work, the terrain of the arranged films was intentional using tiny force microscopy method based on picked article review. The findings pointed out that the morphologies of the surface constructions of thin films change with the dethroning methods and experimental environments.

Author(s) Details:

Ho Soon Min,
Faculty of Health and Life Sciences, INTI International University, Putra Nilai, 71800, Negeri Sembilan, Malaysia.

Please see the link here: https://stm.bookpi.org/NFPSR-V5/article/view/8971

Keywords: Atomic force microscopy, topography, grain size, thin films, semiconductor, metal chalcogenide