Thin Film Studies by Energy Dispersive X-Ray Analysis Technique: Review

Metal chalcogenide thin films have brought the consideration of many scientists by way of singular ocular, tangible and electric features. Characterization of the adapted films has happened completed activity by using various forms. In this work, strength dispersive X-ray analysis (EDX) was used to consider the compositional of samples. The EDX analyst was outfitted accompanying the scanning power microscopy for fast labeling of source. Experimental results presented that the ghost of various materials in particular sample was contingent upon the exploratory environments. Research verdicts also emphasize various stoichiometric possessions could be noticed in the as-located film and annealed samples. The samples able under optimum compositional ratios presented better semantic and fundamental demeanor.

Author(s) Details:

Ho Soonmin,
Faculty of Health and Life Sciences, INTI International University, Putra Nilai-71800, Negeri Sembilan, Malaysia.

Please see the link here: https://stm.bookpi.org/NFPSR-V5/article/view/8854

Keywords: Thin films, compositional analysis, energy dispersive x – ray technique, semiconductor